Single event effects in analog-to-digital converters: Device performance and system impact

Conference · Thu Dec 01 00:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6488760

Turflinger, T L; Davey, M V; Mappes, B M ^[1]

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1. Naval Surface Warfare Center, Crane, IN (United States). Crane Division

Monolithic Analog-to-Digital Converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance.

• OSTI ID: 6488760
• Report Number(s): CONF-940726-; CODEN: IETNAE
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:6Pt1; Conference: 31. annual international nuclear and space radiation effects conference, Tucson, AZ (United States), 18-22 Jul 1994; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANALOG-TO-DIGITAL CONVERTERS
PHYSICAL RADIATION EFFECTS
DATA ANALYSIS
IONS
PROTONS
SPACE FLIGHT
BARYONS
CHARGED PARTICLES
ELECTRONIC EQUIPMENT
ELEMENTARY PARTICLES
EQUIPMENT
FERMIONS
HADRONS
NUCLEONS
RADIATION EFFECTS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems