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Title: Heteroepitaxy of GaAs on Si and Ge using alternating, low-energy ion beams

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.100690· OSTI ID:6482947

Crystalline GaAs films have been grown epitaxially on silicon and germanium substrates at 400 /sup 0/C by direct deposition of alternating /sup 69/Ga and /sup 75/As layers from electromagnetically switched low-energy ion beams. Positive gallium and arsenic ions were extracted simultaneously from a single ion source and mass analyzed prior to deceleration to a controlled deposition energy of 30 or 40 eV. Atomic layers of gallium and arsenic were deposited alternately by switching the analyzing magnetic field repeatedly to select either the /sup 69/Ga/sup +/ or /sup 75/As/sup +/ species. The structure and composition of the resulting layers have been characterized by cross-section transmission electron microscopy and ion channeling/backscattering spectrometry. The best crystal quality was obtained for a GaAs layer deposited on Ge using a 30 eV beam. This layer gave an ion channeling minimum yield of approx. =6%. These results demonstrate the feasibility of growing isotopically pure, single-crystal compound semiconductor layers at relatively low temperatures by deposition from alternating, fully ionized, low-energy beams.

Research Organization:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
OSTI ID:
6482947
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 54:15
Country of Publication:
United States
Language:
English