Submillimeter backward-wave-tube spectrometer-relaxometer
Journal Article
·
· Instrum. Exp. Tech. (Engl. Transl.); (United States)
OSTI ID:6473035
A backward-wave-tube (BWT) spectrometer-relaxometer is described that is designed for study of the relaxation characteristics of photoconductors in the wavelength range of 2-0.25 mm - in particular, to measure the relaxation times of the submillimeter photoconductivity of germanium in the range of 10/sup -4/-10/sup -9/ sec and to determine from these data the concentration of compensating impurities of from 10/sup 10/ to 10/sup 14/ cm/sup -3/. The instrument uses the beats of the oscillations of two BWTs and records the amplitude-frequency response of the specimen with variation of the beat frequency from 10/sup 4/ to 10/sup 8/ Hz with accumulation of the desired signal for less than or equal to1 sec by means of a quadrature synchronous detector. The beat frequency is stabilized and the quadrature voltages of the synchronous detector are formed by means of phase-locked loops.
- Research Organization:
- Moscow State Pedagogical Institute (USSR)
- OSTI ID:
- 6473035
- Journal Information:
- Instrum. Exp. Tech. (Engl. Transl.); (United States), Journal Name: Instrum. Exp. Tech. (Engl. Transl.); (United States) Vol. 30:4; ISSN INETA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360104 -- Metals & Alloys-- Physical Properties
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
AMPLIFICATION
AMPLITUDES
BACKWARD WAVE TUBES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
FREQUENCY MEASUREMENT
FREQUENCY RESPONSE TESTING
GAIN
GERMANIUM
IMPURITIES
MATERIALS TESTING
MEASURING INSTRUMENTS
METALS
MICROWAVE EQUIPMENT
MICROWAVE TUBES
NONDESTRUCTIVE TESTING
OSCILLATIONS
PERFORMANCE
PHOTOCONDUCTIVITY
PHOTOCONDUCTORS
PHYSICAL PROPERTIES
RELAXATION
RELAXATION TIME
SENSITIVITY
SPECTROMETERS
TESTING
360104 -- Metals & Alloys-- Physical Properties
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
AMPLIFICATION
AMPLITUDES
BACKWARD WAVE TUBES
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
FREQUENCY MEASUREMENT
FREQUENCY RESPONSE TESTING
GAIN
GERMANIUM
IMPURITIES
MATERIALS TESTING
MEASURING INSTRUMENTS
METALS
MICROWAVE EQUIPMENT
MICROWAVE TUBES
NONDESTRUCTIVE TESTING
OSCILLATIONS
PERFORMANCE
PHOTOCONDUCTIVITY
PHOTOCONDUCTORS
PHYSICAL PROPERTIES
RELAXATION
RELAXATION TIME
SENSITIVITY
SPECTROMETERS
TESTING