Correlation of current-voltage characteristics of step-edge YBa{sub 2}Cu{sub 3}O{sub 7} Josephson junctions with the step angle
- Forschungszentrum Juelich (Germany)
The authors report on a systematic study of the transport characteristics of YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) step-edge Josephson junctions as a function of the step angle. The microstructure of a YBCO film depends very critically on the step angle a in a SrTiO{sub 3} or LaAlO{sub 3} substrate. Briefly, on shallow steps (0 < {alpha} < 44{degree}) the film grows epitaxially across the step. On 45{degree} steps multiple domains separated by 90{degree} grain boundaries occur in the flank film on the step. On steep steps (46{degree} < {alpha} < 85{degree}) two grain boundaries occur on the step. In this paper it is shown that the 1-5 curves of the step-edge junction reflect the microstructure of the YBCO film on the step. The I-V curves on shallow steps are of flux-flow type. On 45{degree} steps there are several Josephson junctions with different critical currents, while on steep steps two critical currents are found in the 1-5 curve. Summarizing all data, they conclude that the grain boundaries formed on steep steps are responsible for the Josephson behavior of the junctions.
- OSTI ID:
- 64681
- Report Number(s):
- CONF-940142-; ISBN 0-8194-1455-7; TRN: IM9528%%341
- Resource Relation:
- Conference: OE/LASE `94: conference on optics, electro-optics, and laser applications in science and engineering, Los Angeles, CA (United States), 22-29 Jan 1994; Other Information: PBD: 1994; Related Information: Is Part Of Superconductive devices and circuits. Proceedings SPIE Volume 2160; Buhrman, R.A.; Clarke, J.; Daly, K.; Koch, R.H.; Luine, J.A.; Simon, R.W. [eds.]; PB: 272 p.
- Country of Publication:
- United States
- Language:
- English
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