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Title: High-resolution duo-multichannel soft x-ray spectrometer for tokamak plasma diagnostics

Journal Article · · Rev. Sci. Instrum.; (United States)
DOI:https://doi.org/10.1063/1.1139408· OSTI ID:6452806

A high-resolution, time-resolving soft x-ray multichannel spectrometer (SOXMOS) that permits the simultaneous measurement of emission in two different spectral ranges has been developed and tested extensively for tokamak plasma diagnostics. The basic instrument is a high-resolution, interferometrically adjusted, extreme grazing incidence Schwob--Fraenkel duochromator. The instrument is equipped with two multichannel detectors that are adjusted interferometrically and scan along the Rowland circle. Each consists of an MgF/sub 2/ coated, funneled microchannel plate, associated with a phosphor screen image intensifier that is coupled to a 1024-element photodiode array by a flexible fiber-optic conduit. The total wavelength coverage of the instrument is 5--340 A with a measured resolution (FWHM) of about 0.2 A when equipped with a 600-g/mm grating, and 5--85 A with a resolution of about 0.06 A using a 2400-g/mm grating. The simultaneous spectral coverage of each detector varies from 15 A at the short wavelength limit to 70 A at the long wavelength limit with the lower dispersion grating. The minimum readout time for a full spectral portion is 16 ms, but several individual lines can be measured with 1-ms time resolution by selected pixel readout. Higher time resolution can be achieved by replacing one multichannel detector with a single channel electron multiplier detector. Examples of data from the PLT and TFTR tokamaks are presented to illustrate the instrument's versatility, high spectral resolution, and high signal-to-noise ratio even in the 10-A region.

Research Organization:
Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08544
OSTI ID:
6452806
Journal Information:
Rev. Sci. Instrum.; (United States), Vol. 58:9
Country of Publication:
United States
Language:
English