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Title: System for characterizing semiconductor materials and photovoltaic devices through calibration

Abstract

A method and apparatus are disclosed for measuring characteristics of a piece of material, typically semiconductor materials including photovoltaic devices. The characteristics may include dislocation defect density, grain boundaries, reflectance, external LBIC, internal LBIC, and minority carrier diffusion length. The apparatus includes a light source, an integrating sphere, and a detector communicating with a computer. The measurement or calculation of the characteristics is calibrated to provide accurate, absolute values. The calibration is performed by substituting a standard sample for the piece of material, the sample having a known quantity of one or more of the relevant characteristics. The quantity measured by the system of the relevant characteristic is compared to the known quantity and a calibration constant is created thereby. 44 figs.

Inventors:
; ; ; ;
Publication Date:
Research Org.:
Midwest Research Institute, Kansas City, MO (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
644394
Patent Number(s):
US 5,757,474/A/
Application Number:
PAN: 8-496,061
Assignee:
Midwest Research Inst., Kansas City, MO (United States)
DOE Contract Number:  
AC36-83CH10093
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 26 May 1998
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 14 SOLAR ENERGY; SEMICONDUCTOR MATERIALS; DISLOCATIONS; GRAIN BOUNDARIES; OPTICAL PROPERTIES; CALIBRATION; MEASURING METHODS; PHOTOVOLTAIC CELLS; CHARGE CARRIERS; DIAGNOSTIC TECHNIQUES

Citation Formats

Sopori, B L, Allen, L C, Marshall, C, Murphy, R C, and Marshall, T. System for characterizing semiconductor materials and photovoltaic devices through calibration. United States: N. p., 1998. Web.
Sopori, B L, Allen, L C, Marshall, C, Murphy, R C, & Marshall, T. System for characterizing semiconductor materials and photovoltaic devices through calibration. United States.
Sopori, B L, Allen, L C, Marshall, C, Murphy, R C, and Marshall, T. Tue . "System for characterizing semiconductor materials and photovoltaic devices through calibration". United States.
@article{osti_644394,
title = {System for characterizing semiconductor materials and photovoltaic devices through calibration},
author = {Sopori, B L and Allen, L C and Marshall, C and Murphy, R C and Marshall, T},
abstractNote = {A method and apparatus are disclosed for measuring characteristics of a piece of material, typically semiconductor materials including photovoltaic devices. The characteristics may include dislocation defect density, grain boundaries, reflectance, external LBIC, internal LBIC, and minority carrier diffusion length. The apparatus includes a light source, an integrating sphere, and a detector communicating with a computer. The measurement or calculation of the characteristics is calibrated to provide accurate, absolute values. The calibration is performed by substituting a standard sample for the piece of material, the sample having a known quantity of one or more of the relevant characteristics. The quantity measured by the system of the relevant characteristic is compared to the known quantity and a calibration constant is created thereby. 44 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {5}
}