Single-shot measurement of the intensity and phase of an arbitrary ultrashort pulse by using frequency-resolved optical gating
- Southwest Sciences, Inc., Suite E-11, 1570 Pacheco Street, Santa Fe, New Mexico 87501 (United States)
- Combustion Research Facility, Sandia National Laboratories, Livermore, California 94551 (United States)
We introduce a new technique, frequency-resolved optical gating, for measuring the intensity [ital I]([ital t]) and the phase [phi]([ital t]) of an individual arbitrary ultrashort pulse. Using an instantaneous nonlinear-optical interaction of two variably delayed replicas of the pulse, frequency-resolved optical gating involves measuring the spectrum of the signal pulse versus relative delay. The resulting trace, a spectrogram, yields an intuitive full-information display of the pulse. Inversion of this trace to obtain the pulse intensity and phase is equivalent to the well-known two-dimensional phase-retrieval problem and thus yields essentially unambiguous results for [ital I]([ital t]) and [phi]([ital t]).
- OSTI ID:
- 6440158
- Journal Information:
- Optics Letters; (United States), Vol. 18:10, Issue 10; ISSN 0146-9592
- Country of Publication:
- United States
- Language:
- English
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