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Title: Apparatus for measuring minority carrier lifetimes in semiconductor materials

Abstract

An apparatus for determining the minority carrier lifetime of a semiconductor sample includes a positioner for moving the sample relative to a coil. The coil is connected to a bridge circuit such that the impedance of one arm of the bridge circuit is varied as sample is positioned relative to the coil. The sample is positioned relative to the coil such that any change in the photoconductance of the sample created by illumination of the sample creates a linearly related change in the input impedance of the bridge circuit. In addition, the apparatus is calibrated to work at a fixed frequency so that the apparatus maintains a consistently high sensitivity and high linearly for samples of different sizes, shapes, and material properties. When a light source illuminates the sample, the impedance of the bridge circuit is altered as excess carriers are generated in the sample, thereby producing a measurable signal indicative of the minority carrier lifetimes or recombination rates of the sample. 17 figs.

Inventors:
Publication Date:
Sponsoring Org.:
USDOE; USDOE, Washington, DC (United States)
OSTI Identifier:
6438346
Patent Number(s):
US 5929652; A
Application Number:
PPN: US 8-922003
Assignee:
Midwest Research Inst., Kansas City, MO (United States)
DOE Contract Number:  
AC36-83CH10093
Resource Type:
Patent
Resource Relation:
Patent File Date: 2 Sep 1997
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING; CARRIER LIFETIME; DESIGN; MATERIALS TESTING; MEASURING INSTRUMENTS; MEASURING METHODS; PHOTOCONDUCTIVITY; POSITIONING; SAMPLE HOLDERS; SEMICONDUCTOR MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; LIFETIME; MATERIALS; PHYSICAL PROPERTIES; TESTING; 360606* - Other Materials- Physical Properties- (1992-); 420500 - Engineering- Materials Testing

Citation Formats

Ahrenkiel, R K. Apparatus for measuring minority carrier lifetimes in semiconductor materials. United States: N. p., 1999. Web.
Ahrenkiel, R K. Apparatus for measuring minority carrier lifetimes in semiconductor materials. United States.
Ahrenkiel, R K. Tue . "Apparatus for measuring minority carrier lifetimes in semiconductor materials". United States.
@article{osti_6438346,
title = {Apparatus for measuring minority carrier lifetimes in semiconductor materials},
author = {Ahrenkiel, R K},
abstractNote = {An apparatus for determining the minority carrier lifetime of a semiconductor sample includes a positioner for moving the sample relative to a coil. The coil is connected to a bridge circuit such that the impedance of one arm of the bridge circuit is varied as sample is positioned relative to the coil. The sample is positioned relative to the coil such that any change in the photoconductance of the sample created by illumination of the sample creates a linearly related change in the input impedance of the bridge circuit. In addition, the apparatus is calibrated to work at a fixed frequency so that the apparatus maintains a consistently high sensitivity and high linearly for samples of different sizes, shapes, and material properties. When a light source illuminates the sample, the impedance of the bridge circuit is altered as excess carriers are generated in the sample, thereby producing a measurable signal indicative of the minority carrier lifetimes or recombination rates of the sample. 17 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1999},
month = {7}
}