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Title: Single event upset in avionics

Abstract

Data from military/experimental flights and laboratory testing indicate that typical non radiation-hardened 64K and 256K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction (EDAC) circuitry be considered for all avionics designs containing large amounts of semi-conductor memory.

Authors:
 [1];  [2]
  1. (IBM Federal Systems Co., Owego NY (United States))
  2. (Boeing Defense and Space Group, Seattle, WA (United States))
Publication Date:
OSTI Identifier:
6393164
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
Additional Journal Information:
Journal Volume: 40:2; Journal ID: ISSN 0018-9499
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; MEMORY DEVICES; PHYSICAL RADIATION EFFECTS; AIRCRAFT; CORRECTIONS; COSMIC RADIATION; EARTH ATMOSPHERE; ERRORS; FLIGHT TESTING; NEUTRONS; RADIATION HARDENING; RELIABILITY; BARYONS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HARDENING; IONIZING RADIATIONS; NUCLEONS; RADIATION EFFECTS; RADIATIONS; TESTING; 440200* - Radiation Effects on Instrument Components, Instruments, or Electronic Systems

Citation Formats

Taber, A., and Normand, E. Single event upset in avionics. United States: N. p., 1993. Web. doi:10.1109/23.212327.
Taber, A., & Normand, E. Single event upset in avionics. United States. doi:10.1109/23.212327.
Taber, A., and Normand, E. Thu . "Single event upset in avionics". United States. doi:10.1109/23.212327.
@article{osti_6393164,
title = {Single event upset in avionics},
author = {Taber, A. and Normand, E.},
abstractNote = {Data from military/experimental flights and laboratory testing indicate that typical non radiation-hardened 64K and 256K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction (EDAC) circuitry be considered for all avionics designs containing large amounts of semi-conductor memory.},
doi = {10.1109/23.212327},
journal = {IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)},
issn = {0018-9499},
number = ,
volume = 40:2,
place = {United States},
year = {1993},
month = {4}
}