Vacancy defects in (Pb, La)(Zr, Ti)O{sub 3} capacitors observed by positron annihilation
Abstract
A study of vacancy-related defects in ferroelectric capacitors was performed using a variable energy positron beam (VEPB). Heterostructures of (Pb{sub 0.9}La{sub 0.1})(Zr{sub 0.2}Ti{sub 0.8})O{sub 3} (PLZT) ferroelectric with La{sub 0.5}Sr{sub 0.5}CoO{sub 3} (LSCO) electrodes were deposited by pulsed laser deposition and the effects of oxygen deficiency studied using structures grown with 760 and 1{times}10{sup {minus}5}thinspTorr oxygen. The VEPB depth profile showed an increase in vacancy-related defects with increased oxygen nonstoichiometry. A study of LSCO and PLZT thin films was also performed. The formation of vacancy clusters in the LSCO top electrode, and V{sub Pb}{minus}V{sub O} defects in the PLZT layer, with increased oxygen deficiency is inferred. {copyright} {ital 1998 American Institute of Physics.}
- Authors:
-
- Carnegie Laboratory of Physics, University of Dundee, Dundee DD1 4HN (United Kingdom)
- Division of Materials Science, Brookhaven National Laboratory, Upton, New York 11793 (United States)
- Department of Materials Science and Nuclear Engineering, University of Maryland, College Park, Maryland 20742 (United States)
- Army Research Laboratory, Adelphi, Maryland 20783 (United States)
- Publication Date:
- OSTI Identifier:
- 639045
- Resource Type:
- Journal Article
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 73; Journal Issue: 3; Other Information: PBD: Jul 1998
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 66 PHYSICS; LEAD COMPOUNDS; LANTHANUM COMPOUNDS; STOICHIOMETRY; CAPACITORS; FERROELECTRIC MATERIALS; PZT; LANTHANUM ADDITIONS; ELECTRODES; VACANCIES; CRYSTAL DEFECTS; POSITRONS; ANNIHILATION; THIN FILMS
Citation Formats
Keeble, D J, Nielsen, B, Krishnan, A, Lynn, K G, Madhukar, S, Ramesh, R, and Young, C F. Vacancy defects in (Pb, La)(Zr, Ti)O{sub 3} capacitors observed by positron annihilation. United States: N. p., 1998.
Web. doi:10.1063/1.121820.
Keeble, D J, Nielsen, B, Krishnan, A, Lynn, K G, Madhukar, S, Ramesh, R, & Young, C F. Vacancy defects in (Pb, La)(Zr, Ti)O{sub 3} capacitors observed by positron annihilation. United States. https://doi.org/10.1063/1.121820
Keeble, D J, Nielsen, B, Krishnan, A, Lynn, K G, Madhukar, S, Ramesh, R, and Young, C F. Wed .
"Vacancy defects in (Pb, La)(Zr, Ti)O{sub 3} capacitors observed by positron annihilation". United States. https://doi.org/10.1063/1.121820.
@article{osti_639045,
title = {Vacancy defects in (Pb, La)(Zr, Ti)O{sub 3} capacitors observed by positron annihilation},
author = {Keeble, D J and Nielsen, B and Krishnan, A and Lynn, K G and Madhukar, S and Ramesh, R and Young, C F},
abstractNote = {A study of vacancy-related defects in ferroelectric capacitors was performed using a variable energy positron beam (VEPB). Heterostructures of (Pb{sub 0.9}La{sub 0.1})(Zr{sub 0.2}Ti{sub 0.8})O{sub 3} (PLZT) ferroelectric with La{sub 0.5}Sr{sub 0.5}CoO{sub 3} (LSCO) electrodes were deposited by pulsed laser deposition and the effects of oxygen deficiency studied using structures grown with 760 and 1{times}10{sup {minus}5}thinspTorr oxygen. The VEPB depth profile showed an increase in vacancy-related defects with increased oxygen nonstoichiometry. A study of LSCO and PLZT thin films was also performed. The formation of vacancy clusters in the LSCO top electrode, and V{sub Pb}{minus}V{sub O} defects in the PLZT layer, with increased oxygen deficiency is inferred. {copyright} {ital 1998 American Institute of Physics.}},
doi = {10.1063/1.121820},
url = {https://www.osti.gov/biblio/639045},
journal = {Applied Physics Letters},
number = 3,
volume = 73,
place = {United States},
year = {1998},
month = {7}
}