Collection and analysis of single crystal time-of-flight neutron diffraction data

Journal Article · Fri Jan 01 00:00:00 EST 1982 · AIP Conf. Proc.; (United States)

DOI:https://doi.org/10.1063/1.33654· OSTI ID:6337543

Schultz, A J; Teller, R G; Peterson, S W; Williams, J M

This paper describes a single crystal diffractometer (SCD) which uses a position-sensitive area detector for collecting time-of-flight (TOF) neutron diffraction data at Argonne's Intense Pulsed Neutron Source (IPNS). The analysis of data obtained during operation of the prototype ZING-P' pulsed neutron source is also presented.

• Research Organization: Argonne National Lab., IL
• OSTI ID: 6337543
• Journal Information: AIP Conf. Proc.; (United States), Vol. 89
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
NEUTRON DIFFRACTOMETERS
DATA ACQUISITION
DATA ANALYSIS
DESIGN
IPNS-I SYNCHROTRON
NEUTRON SOURCES
PERFORMANCE
POSITION SENSITIVE DETECTORS
PULSED NEUTRON TECHNIQUES
TIME-OF-FLIGHT METHOD
ACCELERATORS
CYCLIC ACCELERATORS
DIFFRACTOMETERS
MEASURING INSTRUMENTS
NEUTRON SOURCE FACILITIES
PARTICLE SOURCES
RADIATION DETECTORS
RADIATION SOURCES
SYNCHROTRONS
440103* - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation