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Title: Interface morphology of CdS thin films grown on cadmium stannate and glass substrates studied by grazing incidence x-ray scattering. [CdS; Cd[sub 2]SnO[sub 4]]

Abstract

The semiconductor CdS is widely used as a window material in many photovoltaic applications. The interface between CdS and the front collector transparent conducting material plays a pivotal role in the solar cells; a physical understanding and control of the interface morphology are needed in order to improve the device performance. Cadmium stannate has recently been recognized as an important transparent conducting material in light of its superior physical properties over the conventional transparent conducting oxides. Physical understanding of the interface between CdS and cadmium stannate is therefore of great practical interest. For this study, the grazing incidence x-ray scattering (GIXS) technique has been demonstrated very useful for the nondestructive characterization of the interface morphology in a variety of layered structures, thus, it is well suited for this task. In the present work, various thin films of CdS deposited on cadmium stannate are investigated by the GIXS technique using synchrotron radiation. Also, similar measurements were made with CdS films deposited on glass substrates for comparison. Variations of surface and interfacial roughness as well as lateral correlation lengths of interface height fluctuations as functions of film thickness and processing conditions are investigated. [copyright] [ital 1999 American Vacuum Society.]

Authors:
; ; ;  [1]; ; ; ;  [2]
  1. (Department of Physics, State University of New York at Buffalo, Amherst, New York 14260 (United States))
  2. (National Renewable Energy Laboratory, Golden, Colorado 80401 (United States))
Publication Date:
OSTI Identifier:
6332394
Alternate Identifier(s):
OSTI ID: 6332394
Resource Type:
Journal Article
Journal Name:
Journal of Vacuum Science and Technology, A
Additional Journal Information:
Journal Volume: 17:5; Journal ID: ISSN 0734-2101
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 14 SOLAR ENERGY; CADMIUM COMPOUNDS; CADMIUM STANNATES; CADMIUM TELLURIDES; INTERFACES; NONDESTRUCTIVE TESTING; ROUGHNESS; SOLAR CELLS; SYNCHROTRON RADIATION; THIN FILMS; X-RAY DIFFRACTION; BREMSSTRAHLUNG; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; EQUIPMENT; FILMS; MATERIALS TESTING; OXYGEN COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATIONS; SCATTERING; SOLAR EQUIPMENT; STANNATES; SURFACE PROPERTIES; TELLURIDES; TELLURIUM COMPOUNDS; TESTING; TIN COMPOUNDS 360602* -- Other Materials-- Structure & Phase Studies; 140501 -- Solar Energy Conversion-- Photovoltaic Conversion

Citation Formats

Huang, S., Soo, Y.L., Bechmann, M., Kao, Y.H., Wu, X., Coutts, T.J., Dhere, R., and Moutinho, H.R. Interface morphology of CdS thin films grown on cadmium stannate and glass substrates studied by grazing incidence x-ray scattering. [CdS; Cd[sub 2]SnO[sub 4]]. United States: N. p., 1999. Web. doi:10.1116/1.581930.
Huang, S., Soo, Y.L., Bechmann, M., Kao, Y.H., Wu, X., Coutts, T.J., Dhere, R., & Moutinho, H.R. Interface morphology of CdS thin films grown on cadmium stannate and glass substrates studied by grazing incidence x-ray scattering. [CdS; Cd[sub 2]SnO[sub 4]]. United States. doi:10.1116/1.581930.
Huang, S., Soo, Y.L., Bechmann, M., Kao, Y.H., Wu, X., Coutts, T.J., Dhere, R., and Moutinho, H.R. Wed . "Interface morphology of CdS thin films grown on cadmium stannate and glass substrates studied by grazing incidence x-ray scattering. [CdS; Cd[sub 2]SnO[sub 4]]". United States. doi:10.1116/1.581930.
@article{osti_6332394,
title = {Interface morphology of CdS thin films grown on cadmium stannate and glass substrates studied by grazing incidence x-ray scattering. [CdS; Cd[sub 2]SnO[sub 4]]},
author = {Huang, S. and Soo, Y.L. and Bechmann, M. and Kao, Y.H. and Wu, X. and Coutts, T.J. and Dhere, R. and Moutinho, H.R.},
abstractNote = {The semiconductor CdS is widely used as a window material in many photovoltaic applications. The interface between CdS and the front collector transparent conducting material plays a pivotal role in the solar cells; a physical understanding and control of the interface morphology are needed in order to improve the device performance. Cadmium stannate has recently been recognized as an important transparent conducting material in light of its superior physical properties over the conventional transparent conducting oxides. Physical understanding of the interface between CdS and cadmium stannate is therefore of great practical interest. For this study, the grazing incidence x-ray scattering (GIXS) technique has been demonstrated very useful for the nondestructive characterization of the interface morphology in a variety of layered structures, thus, it is well suited for this task. In the present work, various thin films of CdS deposited on cadmium stannate are investigated by the GIXS technique using synchrotron radiation. Also, similar measurements were made with CdS films deposited on glass substrates for comparison. Variations of surface and interfacial roughness as well as lateral correlation lengths of interface height fluctuations as functions of film thickness and processing conditions are investigated. [copyright] [ital 1999 American Vacuum Society.]},
doi = {10.1116/1.581930},
journal = {Journal of Vacuum Science and Technology, A},
issn = {0734-2101},
number = ,
volume = 17:5,
place = {United States},
year = {1999},
month = {9}
}