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Title: Low temperature scanning-tip microwave near-field microscopy of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.119776· OSTI ID:632519
; ; ; ;  [1]; ; ; ;  [2]
  1. Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  2. Center for Superconductivity, Department of Physics, University of Maryland, College Park, Maryland 20742 (United States)

We have explored the low temperature capability of a scanning-tip microwave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region under the tip. Patterned YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films were scanned at various temperatures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positions on a film can be detected. Edge-region defects in wet-etched patterns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
632519
Journal Information:
Applied Physics Letters, Vol. 71, Issue 14; Other Information: PBD: Oct 1997
Country of Publication:
United States
Language:
English