Aplanatic and quasi-aplanatic diffraction gratings
Patent
·
OSTI ID:6295691
A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects is described. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.
- Assignee:
- Dept. of Energy, Washington, DC
- Patent Number(s):
- US 4798446
- OSTI ID:
- 6295691
- Resource Relation:
- Patent File Date: Filed date 14 Sep 1987
- Country of Publication:
- United States
- Language:
- English
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OSTI ID:6295691