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Title: Flux creep and high-field critical currents in epitaxial thin films of YBa/sub 2/Cu/sub 3/O/sub 7/

Journal Article · · Phys. Rev. Lett.; (United States)

The critical current density J/sub c/(B,T) is measured to 15 T for c-axis-perpendicular expitaxial thin films of YBa/sub 2/Cu/sub 3/O/sub 7/ with J/sub c/(0,77 K) of order 10/sup 6/ A/cm/sup 2/. Even in the least-favorable perpendicular orientation, critical currents can exceed 5 x 10/sup 5/ A/cm/sup 2/ at 20 K in 15-T fields. Thermally activated flux motion (flux creep) is prominently observed, and can in large part explain the magnitude, temperature, and field dependence of the high-field critical currents.

Research Organization:
Department of Physics, Boston University, Boston, Massachusetts 02215
OSTI ID:
6292759
Journal Information:
Phys. Rev. Lett.; (United States), Vol. 62:17
Country of Publication:
United States
Language:
English