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Title: Negative charge emission due to excimer laser bombardment of sodium trisilicate glass

Abstract

We describe measurements of negative charge emission accompanying irradiation of sodium trisilicate glass (Na{sub 2}O{center dot}3SiO{sub 2}) with 248-nm excimer laser light at fluences on the order of 2 J/cm{sup 2} per pulse, i.e., at the threshold for ablative etching of the glass surface. The negative charge emission consists of a very prompt photoelectron burst coincident with the laser pulse, followed by a much slower plume of electrons and negative ions traveling with a high density cloud of positive ions, previously identified as primarily Na{sup +}. Using combinations of {bold E} and {bold B} fields in conjunction with time-of-flight methods, the negative ions were successfully separated from the plume and tentatively identified as O{sup {minus}}, Si{sup {minus}}, NaO{sup {minus}}, and perhaps NaSi{sup {minus}}. These negative species are probably formed by gas phase collisions in the near-surface region which result in electron attachment.

Authors:
; ;  [1];  [2]
  1. (Physics Department, Washington State University, Pullman, WA (USA))
  2. (Pacific Northwest Laboratories, Richland, WA (USA))
Publication Date:
OSTI Identifier:
6288737
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics; (USA)
Additional Journal Information:
Journal Volume: 68:8; Journal Issue: 8; Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GLASS; PHOTON COLLISIONS; SODIUM SILICATES; EXCIMER LASERS; ION EMISSION; LASER RADIATION; TIME-OF-FLIGHT METHOD; ALKALI METAL COMPOUNDS; COLLISIONS; ELECTROMAGNETIC RADIATION; GAS LASERS; LASERS; OXYGEN COMPOUNDS; RADIATIONS; SILICATES; SILICON COMPOUNDS; SODIUM COMPOUNDS; 360603* - Materials- Properties

Citation Formats

Langford, S.C., Jensen, L.C., Dickinson, J.T., and Pederson, L.R. Negative charge emission due to excimer laser bombardment of sodium trisilicate glass. United States: N. p., 1990. Web. doi:10.1063/1.346216.
Langford, S.C., Jensen, L.C., Dickinson, J.T., & Pederson, L.R. Negative charge emission due to excimer laser bombardment of sodium trisilicate glass. United States. doi:10.1063/1.346216.
Langford, S.C., Jensen, L.C., Dickinson, J.T., and Pederson, L.R. Mon . "Negative charge emission due to excimer laser bombardment of sodium trisilicate glass". United States. doi:10.1063/1.346216.
@article{osti_6288737,
title = {Negative charge emission due to excimer laser bombardment of sodium trisilicate glass},
author = {Langford, S.C. and Jensen, L.C. and Dickinson, J.T. and Pederson, L.R.},
abstractNote = {We describe measurements of negative charge emission accompanying irradiation of sodium trisilicate glass (Na{sub 2}O{center dot}3SiO{sub 2}) with 248-nm excimer laser light at fluences on the order of 2 J/cm{sup 2} per pulse, i.e., at the threshold for ablative etching of the glass surface. The negative charge emission consists of a very prompt photoelectron burst coincident with the laser pulse, followed by a much slower plume of electrons and negative ions traveling with a high density cloud of positive ions, previously identified as primarily Na{sup +}. Using combinations of {bold E} and {bold B} fields in conjunction with time-of-flight methods, the negative ions were successfully separated from the plume and tentatively identified as O{sup {minus}}, Si{sup {minus}}, NaO{sup {minus}}, and perhaps NaSi{sup {minus}}. These negative species are probably formed by gas phase collisions in the near-surface region which result in electron attachment.},
doi = {10.1063/1.346216},
journal = {Journal of Applied Physics; (USA)},
issn = {0021-8979},
number = 8,
volume = 68:8,
place = {United States},
year = {1990},
month = {10}
}