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Title: Evolution of strain-dependent transport properties in ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} films

Abstract

We report on a systematic investigation of strain-induced lattice distortion effects on the crystal structure and transport properties of as-grown and postannealed ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} epitaxial films grown on LaAlO{sub 3} (001) substrates by pulsed laser deposition. The resistivity of the as-grown films is critically dependent on the thickness, i.e., 100 {Angstrom} thick films show insulating behavior, 300 {Angstrom} thick films show metal-insulator transitions, and 500 {Angstrom} thick films show metallic behavior. However, all the annealed films show identical metallic behavior. Conventional {theta}{endash}2{theta} x-ray scans with momentum transfer (q) along the [001] direction, and {theta}{endash}2{theta} scans of the (103) and (113) peaks, with q having a component perpendicular to the growth direction, were used to measure the out-of-plane and in-plane lattice parameters of the sample. {Phi} scans of the (103) and (113) peaks revealed a fourfold symmetry which is consistent with a tetragonal unit cell. These data conclusively show that significantly elongated tetragonal structures (c/a=1.02{endash}1.04) are insulating whilst films with cubic unit cells, relaxed either due to annealing or as a function of thickness, have metallic characteristics. {copyright} {ital 1998 American Institute of Physics.}

Authors:
;  [1];  [2]
  1. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California94720 (United States)
  2. West Virginia University, Physics Department, Morgan Town, West Virginia26506 (United States)
Publication Date:
OSTI Identifier:
627994
Report Number(s):
CONF-980102-
Journal ID: JAPIAU; ISSN 0021-8979; TRN: 98:006308
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 83; Journal Issue: 11; Conference: 7. joint MMM-intermag conference, San Francisco, CA (United States), 6-9 Jan 1998; Other Information: PBD: Jun 1998
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; LANTHANUM COMPOUNDS; STRONTIUM COMPOUNDS; FERROMAGNETIC MATERIALS; ELECTRIC CONDUCTIVITY; THIN FILMS; LANTHANUM OXIDES; STRONTIUM OXIDES; MANGANESE OXIDES; THICKNESS; ANNEALING; LATTICE PARAMETERS; X-RAY DIFFRACTION; TETRAGONAL LATTICES; CRYSTAL STRUCTURE

Citation Formats

Ju, H.L., Krishnan, K.M., and Lederman, D. Evolution of strain-dependent transport properties in ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} films. United States: N. p., 1998. Web. doi:10.1063/1.367864.
Ju, H.L., Krishnan, K.M., & Lederman, D. Evolution of strain-dependent transport properties in ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} films. United States. doi:10.1063/1.367864.
Ju, H.L., Krishnan, K.M., and Lederman, D. Mon . "Evolution of strain-dependent transport properties in ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} films". United States. doi:10.1063/1.367864.
@article{osti_627994,
title = {Evolution of strain-dependent transport properties in ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} films},
author = {Ju, H.L. and Krishnan, K.M. and Lederman, D.},
abstractNote = {We report on a systematic investigation of strain-induced lattice distortion effects on the crystal structure and transport properties of as-grown and postannealed ultrathin La{sub 0.67}Sr{sub 0.33}MnO{sub 3} epitaxial films grown on LaAlO{sub 3} (001) substrates by pulsed laser deposition. The resistivity of the as-grown films is critically dependent on the thickness, i.e., 100 {Angstrom} thick films show insulating behavior, 300 {Angstrom} thick films show metal-insulator transitions, and 500 {Angstrom} thick films show metallic behavior. However, all the annealed films show identical metallic behavior. Conventional {theta}{endash}2{theta} x-ray scans with momentum transfer (q) along the [001] direction, and {theta}{endash}2{theta} scans of the (103) and (113) peaks, with q having a component perpendicular to the growth direction, were used to measure the out-of-plane and in-plane lattice parameters of the sample. {Phi} scans of the (103) and (113) peaks revealed a fourfold symmetry which is consistent with a tetragonal unit cell. These data conclusively show that significantly elongated tetragonal structures (c/a=1.02{endash}1.04) are insulating whilst films with cubic unit cells, relaxed either due to annealing or as a function of thickness, have metallic characteristics. {copyright} {ital 1998 American Institute of Physics.}},
doi = {10.1063/1.367864},
journal = {Journal of Applied Physics},
number = 11,
volume = 83,
place = {United States},
year = {1998},
month = {6}
}