Pulsed laser deposition of epitaxial Ba{sub x}Sr{sub 1{minus}x}TiO{sub 3}/YBa{sub 2}Cu{sub 3}O{sub 7} bilayers on LaAlO{sub 3} substrates
- Univ. of Florida, Gainesville, FL (United States)
YBa{sub 2}Cu{sub 3}O{sub 7}/Ba{sub x}Sr{sub 1{minus}x}TiO{sub 8} bilayers were grown epitaxially on LaAlO{sub 3} substrates using the pulsed laser deposition method. A microstructural investigation revealed that all compositions of Ba{sub x}Sr{sub 1{minus}x}TiO{sub 3} investigated from x = 0 to x = 1 showed (001) orientation and epitaxy across the interface as analyzed by Rutherford backscattering spectroscopy channel yields of <8% for BaTiO{sub 8} on YBa{sub 2}Cu{sub 3}O{sub 7} films. Dielectric properties including the dielectric constant, k, and the loss tangent, tan {delta}, were measured as a function of composition, and it was found that the highest k-values (k = 400) existed for the x = 0.72 composition. 9 refs., 4 figs., 2 tabs.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 62431
- Report Number(s):
- CONF-9302103-; ISSN 0361-5235; TRN: 95:004351-004
- Journal Information:
- Journal of Electronic Materials, Vol. 23, Issue 9; Conference: 122. annual meeting of the Minerals, Metals and Materials Society (TMS), Denver, CO (United States), 21-25 Feb 1993; Other Information: PBD: Sep 1994
- Country of Publication:
- United States
- Language:
- English
Similar Records
Epitaxial thin films of YBa sub 2 Cu sub 3 O sub 7 minus x on LaAlO sub 3 substrates deposited by plasma-enhanced metalorganic chemical vapor deposition
Effect of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} film thickness on the dielectric properties of Ba{sub 0.1}Sr{sub 0.9}TiO{sub 3} in Ag/Ba{sub 0.1}Sr{sub 0.9}TiO{sub 3}/YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}/LaAlO{sub 3} multilayer structures