Biasing scheme for ac coupled strip detectors

Journal Article · Mon Jun 01 00:00:00 EDT 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.682637· OSTI ID:624220

Jordanov, V T ^[1]; Macri, J R; Mayer, M L ^[2]

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1. Amptek Inc., Bedford, MA (United States)
2. Univ. of New Hampshire, Durham, NH (United States). Space Science Center

A new biasing scheme for ac coupled strip detectors has been developed. Application of this scheme reduces the potential non-uniformity due to variations in the strip leakage currents. The circuit comprises an error amplifier that senses the strip current and compensates for the voltage drop across the biasing resistor. The error amplifier is powered by floating power supplies references to the bias voltage. A circuit was built that uses a low power amplifier with femtoamp inputs. The circuit regulates the strip potential to within few mV of the bias voltage for strip currents between 0 and 5 nA with a 1.2 G{Omega} biasing resistor. The circuit has been tested with a CZT strip detector.

• OSTI ID: 624220
• Report Number(s): CONF-971147-; ISSN 0018-9499; TRN: 98:006473
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 45, Issue 3Pt1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Albuquerque, NM (United States), 11-13 Nov 1997; Other Information: PBD: Jun 1998
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ELECTRONIC CIRCUITS
CDTE SEMICONDUCTOR DETECTORS
ELECTRIC POTENTIAL
LEAKAGE CURRENT
AMBIENT TEMPERATURE