skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Electron Energy-Loss Spectroscopy: Fundamentals and applications in the characterization of minerals

Conference ·
OSTI ID:6224209

The combined use of an energy-loss spectrometer and an analytical electron microscope with fine probe forming capabilities provides a wealth of information about the sample at high spatial resolution. Fundamental principles governing the physics of the interaction between the fast electron and a thin foil sample, to account for the fine structure in the inelastically scattered fast electron distribution (Electron-Energy Loss Spectroscopy, EELS), will be reviewed. General application of EELS is in the area of low atomic number elements (Z < 11) microanalysis, where it significantly complements the more widely used Energy Dispersive X-ray Spectroscopy (EDXS). However, a careful analysis of the low loss plasmon oscillations and the fine structure in the core-loss edges, can provide additional information related to the bonding and electronic structure of the sample. An illustration of this is presented from our study of Cdelta diamond residue from the Allende carbonaceous chondrite. Combination of EELS with channeling effects can provide specific site occupation/valence information in crystalline materials. Details of this novel crystallographic method will be outlined and illustrated with an example of the study of chromite spinels. Finally, some pertinent experimental details will be discussed. 7 figs.

Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
6224209
Report Number(s):
LBL-27014; CONF-880912-30; ON: DE89013420
Resource Relation:
Conference: 196. American Chemical Society national meeting, Los Angeles, CA, USA, 25 Sep 1988; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English