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Title: Solute segregation to phase interfaces and grain boundaries: Studies by analytical electron microscopy and profile deconvolution

Abstract

Mathematical deconvolution of the observed composition profiles at the interface or boundary with the x-ray generation profile to determine the actual composition profile is a viable procedure for extracting compositional data on a spatial scale smaller than the inherent resolution of thin foil x-ray microanalysis. In sufficiently thin foils, the x-ray generation profile can be calculated with the single scattering model. In thicker foils, the x-ray generation profile can be calculated with Monte Carlo techniques. Explicit deconvolution is, in general, not possible mathematically, but it can be accomplished numerically through iterative convolutions. Convolution of the x-ray generation profile with the assumed actual composition profile allows for direct calculation of the expected composition profile. The convolution procedure using various assumed actual concentration profiles is repeated iteratively until the calculated profile and the observed profile correspond. This paper describes the convolution process and introduces a rapid graphical solution to the problem, compares the convolution process using the single scattering model and Monte Carlo techniques, and discusses the limitations of the deconvolution procedure. This study uses the recently reported data of Ti enrichment at grain boundaries in an Fe-Ni superalloy (Alloy 800).

Authors:
;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (USA)
OSTI Identifier:
6202671
Report Number(s):
SAND-87-1773C; CONF-870733-4
ON: DE87012129
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Conference
Resource Relation:
Conference: Pacific workshop and meeting on analytical electron microscopy, Kona, HI, USA, 12 Jul 1987; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRON MICROPROBE ANALYSIS; SPECTRA UNFOLDING; IRON BASE ALLOYS; GRAIN BOUNDARIES; BEAM PROFILES; COMPARATIVE EVALUATIONS; ELECTRON MICROSCOPY; ITERATIVE METHODS; MONTE CARLO METHOD; PHASE TRANSFORMATIONS; REACTION KINETICS; SCATTERING; X-RAY SOURCES; ALLOYS; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; DATA PROCESSING; EQUIPMENT; IRON ALLOYS; KINETICS; MICROANALYSIS; MICROSCOPY; MICROSTRUCTURE; PROCESSING; RADIATION SOURCES; X-RAY EQUIPMENT; 656002* - Condensed Matter Physics- General Techniques in Condensed Matter- (1987-)

Citation Formats

Romig, Jr, A D, and Cieslak, M J. Solute segregation to phase interfaces and grain boundaries: Studies by analytical electron microscopy and profile deconvolution. United States: N. p., 1987. Web.
Romig, Jr, A D, & Cieslak, M J. Solute segregation to phase interfaces and grain boundaries: Studies by analytical electron microscopy and profile deconvolution. United States.
Romig, Jr, A D, and Cieslak, M J. Thu . "Solute segregation to phase interfaces and grain boundaries: Studies by analytical electron microscopy and profile deconvolution". United States.
@article{osti_6202671,
title = {Solute segregation to phase interfaces and grain boundaries: Studies by analytical electron microscopy and profile deconvolution},
author = {Romig, Jr, A D and Cieslak, M J},
abstractNote = {Mathematical deconvolution of the observed composition profiles at the interface or boundary with the x-ray generation profile to determine the actual composition profile is a viable procedure for extracting compositional data on a spatial scale smaller than the inherent resolution of thin foil x-ray microanalysis. In sufficiently thin foils, the x-ray generation profile can be calculated with the single scattering model. In thicker foils, the x-ray generation profile can be calculated with Monte Carlo techniques. Explicit deconvolution is, in general, not possible mathematically, but it can be accomplished numerically through iterative convolutions. Convolution of the x-ray generation profile with the assumed actual composition profile allows for direct calculation of the expected composition profile. The convolution procedure using various assumed actual concentration profiles is repeated iteratively until the calculated profile and the observed profile correspond. This paper describes the convolution process and introduces a rapid graphical solution to the problem, compares the convolution process using the single scattering model and Monte Carlo techniques, and discusses the limitations of the deconvolution procedure. This study uses the recently reported data of Ti enrichment at grain boundaries in an Fe-Ni superalloy (Alloy 800).},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}

Conference:
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