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Title: Carbon impurity characterization on a linear plasma device using visible emission spectroscopy. [Be]

Abstract

Visible emission spectroscopy is used to quantify the carbon impurity concentration in the linear plasma divertor simulator of the Plasma Interaction Surface Component Experimental Station (PISCES-B). A technique has been developed to obtain noninvasively the absolute photometric calibration of a visible spectrometer in order to minimize exposure of equipment in the beryllium safety enclosure of PISCES-B. The principal intrinsic source of carbon appears to be chemical sputtering at the vessel walls, with a typical background concentration [approximately]0.2[percent] with deuterium plasmas. Helium plasmas have a lower carbon contamination [approximately]0.01[percent]. Methane gas injection is used to increase the carbon contamination in a controlled manner to better simulate tokamak edge plasma conditions. It is found that the spectroscopic method of determining the carbon fraction agrees well with the relative gaseous carbon contamination measured with a residual gas analyzer during plasma operations. [copyright] [ital 1999 American Vacuum Society.]

Authors:
; ;  [1]
  1. (Fusion Energy Research Program, University of California, San Diego, La Jolla, California 92093-0417 (United States))
Publication Date:
OSTI Identifier:
6200942
Alternate Identifier(s):
OSTI ID: 6200942
Resource Type:
Journal Article
Journal Name:
Journal of Vacuum Science and Technology, A
Additional Journal Information:
Journal Volume: 17:5; Journal ID: ISSN 0734-2101
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; BERYLLIUM; CARBON; EMISSION SPECTROSCOPY; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; PROTECTIVE COATINGS; TOKAMAK DEVICES; VISIBLE SPECTRA; ALKALINE EARTH METALS; CLOSED PLASMA DEVICES; COATINGS; ELEMENTS; IMPURITIES; METALS; NONMETALS; SPECTRA; SPECTROSCOPY; THERMONUCLEAR DEVICES 700420* -- Fusion Technology-- Plasma-Facing Components-- (1992-)

Citation Formats

Whyte, D.G., Seraydarian, R.P., and Doerner, R.P. Carbon impurity characterization on a linear plasma device using visible emission spectroscopy. [Be]. United States: N. p., 1999. Web. doi:10.1116/1.581935.
Whyte, D.G., Seraydarian, R.P., & Doerner, R.P. Carbon impurity characterization on a linear plasma device using visible emission spectroscopy. [Be]. United States. doi:10.1116/1.581935.
Whyte, D.G., Seraydarian, R.P., and Doerner, R.P. Wed . "Carbon impurity characterization on a linear plasma device using visible emission spectroscopy. [Be]". United States. doi:10.1116/1.581935.
@article{osti_6200942,
title = {Carbon impurity characterization on a linear plasma device using visible emission spectroscopy. [Be]},
author = {Whyte, D.G. and Seraydarian, R.P. and Doerner, R.P.},
abstractNote = {Visible emission spectroscopy is used to quantify the carbon impurity concentration in the linear plasma divertor simulator of the Plasma Interaction Surface Component Experimental Station (PISCES-B). A technique has been developed to obtain noninvasively the absolute photometric calibration of a visible spectrometer in order to minimize exposure of equipment in the beryllium safety enclosure of PISCES-B. The principal intrinsic source of carbon appears to be chemical sputtering at the vessel walls, with a typical background concentration [approximately]0.2[percent] with deuterium plasmas. Helium plasmas have a lower carbon contamination [approximately]0.01[percent]. Methane gas injection is used to increase the carbon contamination in a controlled manner to better simulate tokamak edge plasma conditions. It is found that the spectroscopic method of determining the carbon fraction agrees well with the relative gaseous carbon contamination measured with a residual gas analyzer during plasma operations. [copyright] [ital 1999 American Vacuum Society.]},
doi = {10.1116/1.581935},
journal = {Journal of Vacuum Science and Technology, A},
issn = {0734-2101},
number = ,
volume = 17:5,
place = {United States},
year = {1999},
month = {9}
}