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Title: Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy. [C]

Abstract

Photoemission electron spectromicroscopy with synchrotron radiation has been used to study the correlation between the chemical surface composition and secondary electron yield from the surface of amorphous carbon films. Regions of about 4 [mu]m diam were found which exhibited up to ten times higher secondary electron emission than the rest of the film. Near edge x-ray absorption fine structure spectroscopy of these regions showed that they contained highly oxidized carbon in the form of carboxylic and carbonate groups. These observations might be linked to the field emission properties of these films. [copyright] [ital 1999 American Vacuum Society.]

Authors:
; ;  [1]; ;  [2]
  1. (Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States))
  2. (IBM Research Division, Almaden Research Center, San Jose, California 95120 (United States))
Publication Date:
OSTI Identifier:
6189754
Alternate Identifier(s):
OSTI ID: 6189754
Resource Type:
Journal Article
Journal Name:
Journal of Vacuum Science and Technology, A
Additional Journal Information:
Journal Volume: 17:5; Journal ID: ISSN 0734-2101
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AMORPHOUS STATE; CARBON; ELECTRON EMISSION; MICROSCOPY; OXIDATION; SECONDARY EMISSION; SYNCHROTRON RADIATION; THIN FILMS; X-RAY SPECTROSCOPY; BREMSSTRAHLUNG; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FILMS; NONMETALS; RADIATIONS; SPECTROSCOPY 360606* -- Other Materials-- Physical Properties-- (1992-); 665100 -- Nuclear Techniques in Condensed Matter Physics -- (1992-)

Citation Formats

Diaz, J., Anders, S., Cossy-Favre, A., Samant, M., and Stoehr, J. Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy. [C]. United States: N. p., 1999. Web. doi:10.1116/1.581938.
Diaz, J., Anders, S., Cossy-Favre, A., Samant, M., & Stoehr, J. Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy. [C]. United States. doi:10.1116/1.581938.
Diaz, J., Anders, S., Cossy-Favre, A., Samant, M., and Stoehr, J. Wed . "Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy. [C]". United States. doi:10.1116/1.581938.
@article{osti_6189754,
title = {Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy. [C]},
author = {Diaz, J. and Anders, S. and Cossy-Favre, A. and Samant, M. and Stoehr, J.},
abstractNote = {Photoemission electron spectromicroscopy with synchrotron radiation has been used to study the correlation between the chemical surface composition and secondary electron yield from the surface of amorphous carbon films. Regions of about 4 [mu]m diam were found which exhibited up to ten times higher secondary electron emission than the rest of the film. Near edge x-ray absorption fine structure spectroscopy of these regions showed that they contained highly oxidized carbon in the form of carboxylic and carbonate groups. These observations might be linked to the field emission properties of these films. [copyright] [ital 1999 American Vacuum Society.]},
doi = {10.1116/1.581938},
journal = {Journal of Vacuum Science and Technology, A},
issn = {0734-2101},
number = ,
volume = 17:5,
place = {United States},
year = {1999},
month = {9}
}