Universal correlations between T/sub c/ and n/sub s//m (carrier density over effective mass) in high-T/sub c/ cuprate superconductors
The muon-spin-relaxation rate sigma has been measured in sixteen specimens of high-T/sub c/ cuprate superconductors (the 2:1:4, 1:2:3, 2:2:1:2, and 2:2:2:3 series). This has allowed us to study the magnetic field penetration depth lambda and thus the superconducting carrier density n/sub s/ divided by the effective mass m/sup */ (sigmaproportional1/lambda/sup 2/proportionaln/sub s//m/sup */). A universal linear relation between T/sub c/ and sigma(T..-->..0)proportionaln/sub s//m/sup */ has been found with increasing carrier doping. In heavily doped samples, however, T/sub c/ shows saturation and suppression with increasing n/sub s//m/sup */. This saturation starts at different values of n/sub s//m/sup */ for materials with different multiplicities of CuO planes.
- Research Organization:
- Department of Physics, Columbia University, New York City, New York 10027
- OSTI ID:
- 6182621
- Journal Information:
- Phys. Rev. Lett.; (United States), Vol. 62:19
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
COPPER OXIDES
EFFECTIVE MASS
SUPERCONDUCTORS
CHEMICAL COMPOSITION
DOPED MATERIALS
INHIBITION
MUON PROBES
PENETRATION DEPTH
SATURATION
TRANSITION TEMPERATURE
CHALCOGENIDES
COPPER COMPOUNDS
MASS
MATERIALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PROBES
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties