Soft x-ray fluorescence spectroscopy using tunable synchrotron radiation

Conference · Mon Aug 01 00:00:00 EDT 1994

OSTI ID:61760

Nordgren, E J ^[1]

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1. Uppsala Univ. (Sweden)

The third generation synchrotron radiation sources open up new interesting possibilities for soft x-ray emission spectroscopy (SXES) for the study of various problems in materials science and atomic and molecular physics. High brightness of the excitation source is a prerequisite for pursuing SXES, since the overall yields are very small owing to both low fluorescence yields and low efficiencies of high resolution soft x-ray detectors. However, the very brightness offered by the third generation synchrotron radiation sources even allows the exciting beam to be sharply monochromatised, a condition which very much increases the information potential of this spectroscopic technique.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• OSTI ID: 61760
• Report Number(s): ANL/APS/TM-14; CONF-9404198-; ON: DE95006077; TRN: 95:001319-0005
• Resource Relation: Conference: Workshop on atomic physics at high brilliance synchrotron sources, Argonne, IL (United States), 23-24 Apr 1994; Other Information: PBD: Aug 1994; Related Information: Is Part Of Atomic physics at high brilliance synchrotron sources: Proceedings; Berry, G.; Cowan, P.; Gemmell, D.; PB: 330 p.
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
SOLIDS
FLUORESCENCE SPECTROSCOPY
SYNCHROTRON RADIATION SOURCES
SOFT X RADIATION