In situ high voltage electron microscope studies of ion- and electron-beam induced modification of materials. [Ni-Al]

Conference · Fri Nov 01 00:00:00 EST 1985

OSTI ID:6147495

Okamoto, P R; Lam, N Q; Taylor, A

In situ high-voltage electron microscope (HVEM) studies have shown that the highly focused electron beams normally employed for irradiation purposes in the HVEM can cause easily measurable composition changes in the irradiated volume of thin alloy films (Ni-Al). The kinetics of this ''beam-induced'' composition change has been investigated and found to exhibit a strong dependence not only on temperature and peak electron flux, but also on the beam diameter. The dependence on beam diameter has far reaching implications for HVEM studies of radiation effects in alloys, and for microchemical analysis techniques such as EDX and EELS.

• Research Organization: Argonne National Lab., IL (USA)
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 6147495
• Report Number(s): CONF-8511159-1; ON: DE86005577
• Resource Relation: Conference: International symposium on behavior or lattice imperfections in materials: in situ experiments with HVEM, Osaka, Japan, 18 Nov 1985; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM ALLOYS
PHYSICAL RADIATION EFFECTS
NICKEL BASE ALLOYS
BINARY ALLOY SYSTEMS
ELECTRON BEAMS
ELECTRON MICROSCOPY
HIGH TEMPERATURE
MEV RANGE 01-10
PRECIPITATION HARDENING
SEGREGATION
ALLOY SYSTEMS
ALLOYS
BEAMS
ENERGY RANGE
HARDENING
LEPTON BEAMS
MEV RANGE
MICROSCOPY
NICKEL ALLOYS
PARTICLE BEAMS
RADIATION EFFECTS
360106* - Metals & Alloys- Radiation Effects