Dielectric properties of thin film SrTiO{sub 3} grown on LaAlO{sub 3} with YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} electrodes

Conference · Sat Dec 31 00:00:00 EST 1994

OSTI ID:61242

Wu, H D; Barnes, F S ^[1]; Galt, D; Price, J ^[2]; Beall, J A ^[3]

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1. Univ. of Colorado, Boulder, CO (United States). Dept. of Electrical Engineering
2. Univ. of Colorado, Boulder, CO (United States). Dept. of Physics
3. National Institute of Standards and Technology, Boulder, CO (United States). Electromagnetic Technology Division

The authors have fabricated and characterized YBCO (YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}) microstrip resonators on LAO (LaAlO{sub 3}) substrates that include thin film STO (SrTiO{sub 3}) coplanar capacitors to study the dielectric properties of thin film STO. The low frequency capacitance of the STO/LAO capacitor is measured as a function of temperature and dc bias. They use the observed resonant frequencies to extract the microwave frequency capacitance of the structure and the Q`s to determine the microwave losses. A conformal map is developed and used to transform the observed capacitances into dielectric constant values for the thin film STO.

• OSTI ID: 61242
• Report Number(s): CONF-940142-; ISBN 0-8194-1451-4; TRN: IM9526%%23
• Resource Relation: Conference: OE/LASE `94: conference on optics, electro-optics, and laser applications in science and engineering, Los Angeles, CA (United States), 22-29 Jan 1994; Other Information: PBD: 1994; Related Information: Is Part Of High {Tc} microwave superconductors and applications. Volume 2156; Hammond, R.B.; Withers, R.S. [eds.]; PB: 235 p.
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
STRONTIUM TITANATES
DIELECTRIC PROPERTIES
MICROWAVE EQUIPMENT
DIELECTRIC MATERIALS
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
LANTHANUM OXIDES
ALUMINIUM OXIDES
FERROELECTRIC MATERIALS
MEASURING METHODS