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Title: Magnetic field controlled high-{Tc} thick film microstrip ring resonators

Book ·
OSTI ID:61241
;  [1];  [2]
  1. Univ. of Oulu (Finland)
  2. Eoetvoes Univ., Budapest (Hungary). Dept. for Low Temperature Physics

The influence of small external magnetic field on microwave properties of superconductor thick film ring resonators has been studied at various cryogenic temperatures. The ring resonators made of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) and Bi{sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10+{delta}} (BSCCO) materials were realized by screen printing on yttrium stabilized ZrO{sub 2} (YSZ) and (100) oriented single crystal MgO substrates. External magnetic fields were found to have a strong effect on the microwave reflection of the superconducting ring resonators. Increasing the field first causes the loaded quality factor (Q{sub L}) value to reach a maximum but further increasing the field decreases the Q{sub L} below the zero field value. For example, the maximum change in the quality factor of an YBCO resonator on an YSZ substrate at a resonance frequency of 14,93 GHz was raised to nearly 80,000 by increasing the magnetic flux density from 1.0 to 2.0 mT at a temperature of 50 K. Similarly, the BSCCO ring resonators on MgO substrates were found to be less sensitive; they needed stronger magnetic field changes than the YBCO resonators for the same change in Q{sub L}-value. These magnetic field-controllable microwave resonators may offer (1) a new method to improve the properties of microwave resonators and other microwave devices and (2) a new method to construct new types of devices (e.g. magnetic field sensors of high sensitivity).

OSTI ID:
61241
Report Number(s):
CONF-940142-; ISBN 0-8194-1451-4; TRN: IM9526%%22
Resource Relation:
Conference: OE/LASE `94: conference on optics, electro-optics, and laser applications in science and engineering, Los Angeles, CA (United States), 22-29 Jan 1994; Other Information: PBD: 1994; Related Information: Is Part Of High {Tc} microwave superconductors and applications. Volume 2156; Hammond, R.B.; Withers, R.S. [eds.]; PB: 235 p.
Country of Publication:
United States
Language:
English