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Title: Design and simulation of a fast Josephson junction on-chip gated clock for frequency and time analysis

Abstract

This paper reports that as the sophistication and speed of digital communication systems increase, there is a corresponding demand for more sophisticated and faster measurement instruments. One such instrument new on the market is the HP 5371A Frequency and Time Interval Analyzer (FTIA). Such an instrument is analogous to a conventional oscilloscope. Whereas the oscilloscope measures waveform amplitudes as a function of time, the FTIA measures phase, frequency, or timing events as functions of time. These applications are useful in such diverse areas as spread-spectrum radar, chirp filter designs, disk-head evaluation, and timing jitter analysis. The on-chip clock designed for this application uses a single Josephson Junction as the clock and a resonator circuit to fix the frequency. A zero-crossing detector is used to start and stop the clock. A SFQ counter is used to count the pulses generated by the clock and a reset circuit is used to reset the clock. Extensive simulations and modeling have been done based on measured values obtained from our Nb/Al{sub 2}O{sub 3}/Al/Nb process.

Authors:
 [1]
  1. Hewlett-Packard Co., Palo Alto, CA (United States)
Publication Date:
OSTI Identifier:
6088491
Report Number(s):
CONF-900944-
Journal ID: ISSN 0018-9464; CODEN: IEMGA
Resource Type:
Conference
Journal Name:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
Additional Journal Information:
Journal Volume: 27:2; Conference: 1990 applied superconductivity conference, Snowmass, CO (United States), 24-28 Sep 1990; Journal ID: ISSN 0018-9464
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; JOSEPHSON JUNCTIONS; DESIGN; PULSE GENERATORS; TIME INTERVAL ANALYZERS; ALUMINIUM OXIDES; COMPUTERIZED SIMULATION; DIGITAL SYSTEMS; FILTERS; FREQUENCY DEPENDENCE; NIOBIUM; RADAR; TIME DEPENDENCE; ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FUNCTION GENERATORS; JUNCTIONS; MEASURING INSTRUMENTS; METALS; OXIDES; OXYGEN COMPOUNDS; RANGE FINDERS; SIMULATION; SUPERCONDUCTING JUNCTIONS; TRANSITION ELEMENTS; 665412* - Superconducting Devices- (1992-); 990200 - Mathematics & Computers; 665411 - Basic Superconductivity Studies- (1992-)

Citation Formats

Ruby, R C. Design and simulation of a fast Josephson junction on-chip gated clock for frequency and time analysis. United States: N. p., 1991. Web.
Ruby, R C. Design and simulation of a fast Josephson junction on-chip gated clock for frequency and time analysis. United States.
Ruby, R C. Fri . "Design and simulation of a fast Josephson junction on-chip gated clock for frequency and time analysis". United States.
@article{osti_6088491,
title = {Design and simulation of a fast Josephson junction on-chip gated clock for frequency and time analysis},
author = {Ruby, R C},
abstractNote = {This paper reports that as the sophistication and speed of digital communication systems increase, there is a corresponding demand for more sophisticated and faster measurement instruments. One such instrument new on the market is the HP 5371A Frequency and Time Interval Analyzer (FTIA). Such an instrument is analogous to a conventional oscilloscope. Whereas the oscilloscope measures waveform amplitudes as a function of time, the FTIA measures phase, frequency, or timing events as functions of time. These applications are useful in such diverse areas as spread-spectrum radar, chirp filter designs, disk-head evaluation, and timing jitter analysis. The on-chip clock designed for this application uses a single Josephson Junction as the clock and a resonator circuit to fix the frequency. A zero-crossing detector is used to start and stop the clock. A SFQ counter is used to count the pulses generated by the clock and a reset circuit is used to reset the clock. Extensive simulations and modeling have been done based on measured values obtained from our Nb/Al{sub 2}O{sub 3}/Al/Nb process.},
doi = {},
journal = {IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)},
issn = {0018-9464},
number = ,
volume = 27:2,
place = {United States},
year = {1991},
month = {3}
}

Conference:
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