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Title: Materials for solar thermal conversion. Quarterly report No. 1, September 1--December 31, 1977. [Ge--CaF/sub 2/ and Si--CaF/sub 2/ composites]

Technical Report ·
DOI:https://doi.org/10.2172/6049538· OSTI ID:6049538

Specimens of Ge--CaF/sub 2/ and Si--CaF/sub 2/ composites have been prepared for: (1) the determination of the optical constants; (2) the characterization of the composite semiconductors; and (3) reflectance measurements (when specimens were deposited on mirror substrates). While the results of Auger, ESCA and TEM analyses are not yet available, a picture of the composite semiconductors is beginning to emerge based on the wavelength dependence of the optical constants. As noted in the previous section ..cap alpha.. = A(h..nu..--E/sub 0/)/sup 2/ where A increases as f/sub v/ increases and E/sub 0/ is independent of f/sub v/. Thus, the semiconductor composites behave like semiconductors with an energy gap equal to that of the semiconductor component and with a reduced index of refraction. The above property is just the one needed for efficient selective absorption. This is demonstrated by the reflectance of the composite films on mirrors. The reflectance measurements also reveal unexpected absorption bands which may be due to chemical reaction between the semiconductors and the insulator. When the source of this absorption is determined, methods of eliminating it will be explored.

Research Organization:
RCA Labs., Princeton, NJ (USA)
DOE Contract Number:
EG-77-C-02-4557
OSTI ID:
6049538
Report Number(s):
TID-28787
Country of Publication:
United States
Language:
English