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Title: Microwave noise parameter measurements of a high temperature superconducting flux flow transistor

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6045557
; ; ;  [1]
  1. Wisconsin Univ., Madison, WI (United States). Dept. of Electrical and Computer Engineering

This paper reports on the noise parameters of a HTS flux flow transistor made of TiBaCaCuO operating at 77 K and 3--5 GHz experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance and were calculated by measuring the noise figure with a number of different source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz.

OSTI ID:
6045557
Report Number(s):
CONF-900944-; CODEN: IEMGA
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Vol. 27:2; Conference: 1990 applied superconductivity conference, Snowmass, CO (United States), 24-28 Sep 1990; ISSN 0018-9464
Country of Publication:
United States
Language:
English