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Title: Testing of full scale ITER OHMIC heating coil conductors

Technical Report ·
DOI:https://doi.org/10.2172/6008190· OSTI ID:6008190

The optimized conductor, ''CICC-OH-1'' is designed for 12.5 T operation at 30 kA with an I(op) /I(crit) ratio (R/sub I/) of 0.5, with B/sub max/ = 14.7 T at R/sub I/ = 1.0. To use ''CICC-OH-1'' in the 2.5 m bore OH Coil, the CIC is co-wound with a structural band, sized to limit tensile strength to 50% of Yield at 30 kA and 12.5 T. When wound into a 1.3 m bore test coil, tensile stress in the ''CICC-OH-1'' conduit equals 50% of Yield at 30 kA and 12.5 T. The conductor requires no additional inter-turn structure in this coil configuration. Conduit thickness of the ''CICC-OH-1'' permits a minimum bend radius of 0.5 m. A 1.3 m bore test coil could be economically produced by upgrading the JAERI DPCF Test Facility. The DPCF increase in field would be achieved by the replacement of its 30 kA NbTi DPC-U1 and U2 field coils with coils using new 30 kA Nb/sub 3/Sn conductor. The upgraded DPCF Coil would consist of three or four 1.3 m bore pairs of coil modules. Conductor used would be ''CICC-OH-1'' or equivalent. Three or four full scale candidate OH Coil conductors, provided by different sponsors could thus be readily evaluated as part of the upgraded DPC Facility. The proposed test coil could also accommodate test pancakes or modules of other conductors. We believe that an upgrade of the existing DPCF facility, with an investment of $M 20 in a new 3-Module-Pair Coil, is feasible. The investment could logically be shared by three and four sponsors. The upgrade would also have to include modifications to the DPCF Cryogenic system to accommodate higher AC loss. 12 figs., 2 tabs.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States). Plasma Science and Fusion Center
DOE Contract Number:
AC02-78ET51013
OSTI ID:
6008190
Report Number(s):
DOE/ET/51013-263; ON: DE89014650; TRN: 89-017743
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English