skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Convergent x-ray monochromator for molecular microprobe analysis

Abstract

An improved apparatus and method are provided for electron spectroscopy for chemical analysis which permits analysis of micron sized regions of a heterogeneous sample surface. The apparatus includes a source of multidirectional X-ray radiation. A hollow cylindrical body receives the multidirectional X-ray radiation. The hollow cylindrical body includes a plurality of beam directing Johannsen-type diffracting crystals elements arrayed symmetrically and circumferentially around an axis of symmetry extending from the source of X-ray radiation to a surface of the sample. The array of Johannsen-type diffracting crystals transforms the multidirectional X-ray radiation into a hollow cone of monochromatic X-ray radiation that converges on a micron sized region on the sample surface. A screen opaque to X-rays is located along the axis of symmetry between the source of X-ray radiation and the sample. The screen prevents X-rays from the source from reaching the sample without being directed and diffracted by the beam directing and diffracting elements. An electron detector located along the axis of symmetry detects electrons emitted from the micron sized region of the sample surface. The electron detector is located between the X-ray screen and the sample surface. 4 figs.

Inventors:
Publication Date:
Research Org.:
Bettis Atomic Power Lab., West Mifflin, PA (United States)
Sponsoring Org.:
USDOE; USDOE, Washington, DC (United States)
OSTI Identifier:
6003309
Patent Number(s):
PATENTS-US-A7529403
Application Number:
ON: DE92004619; PPN: US 7-529403
Assignee:
Dept. of Energy
DOE Contract Number:  
AC11-89PN38014
Resource Type:
Patent Application
Resource Relation:
Patent File Date: 29 May 1990
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ALUMINIUM; K SHELL; MAGNESIUM; X RADIATION; MONOCHROMATORS; FOCUSING; INVENTIONS; MICROANALYSIS; PHOTOELECTRON SPECTROSCOPY; ALKALINE EARTH METALS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ELEMENTS; IONIZING RADIATIONS; METALS; RADIATIONS; SPECTROSCOPY; 440800* - Miscellaneous Instrumentation- (1990-); 400102 - Chemical & Spectral Procedures

Citation Formats

Gamba, O O.M. Convergent x-ray monochromator for molecular microprobe analysis. United States: N. p., 1990. Web.
Gamba, O O.M. Convergent x-ray monochromator for molecular microprobe analysis. United States.
Gamba, O O.M. Mon . "Convergent x-ray monochromator for molecular microprobe analysis". United States.
@article{osti_6003309,
title = {Convergent x-ray monochromator for molecular microprobe analysis},
author = {Gamba, O O.M.},
abstractNote = {An improved apparatus and method are provided for electron spectroscopy for chemical analysis which permits analysis of micron sized regions of a heterogeneous sample surface. The apparatus includes a source of multidirectional X-ray radiation. A hollow cylindrical body receives the multidirectional X-ray radiation. The hollow cylindrical body includes a plurality of beam directing Johannsen-type diffracting crystals elements arrayed symmetrically and circumferentially around an axis of symmetry extending from the source of X-ray radiation to a surface of the sample. The array of Johannsen-type diffracting crystals transforms the multidirectional X-ray radiation into a hollow cone of monochromatic X-ray radiation that converges on a micron sized region on the sample surface. A screen opaque to X-rays is located along the axis of symmetry between the source of X-ray radiation and the sample. The screen prevents X-rays from the source from reaching the sample without being directed and diffracted by the beam directing and diffracting elements. An electron detector located along the axis of symmetry detects electrons emitted from the micron sized region of the sample surface. The electron detector is located between the X-ray screen and the sample surface. 4 figs.},
doi = {},
url = {https://www.osti.gov/biblio/6003309}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}