Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method
Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density and electron density gradients.
- Research Organization:
- Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany
- OSTI ID:
- 6003216
- Journal Information:
- Appl. Opt.; (United States), Vol. 25:5
- Country of Publication:
- United States
- Language:
- English
Similar Records
Laser schlieren deflectometry for temperature analysis of filamentary non-thermal atmospheric pressure plasma
Characterization of laser-produced plasma density profiles using grid image refractometry