A method of improving photon detection efficiency of high purity germanium cameras by including double-interaction photopeak events
The authors propose a method to utilize double-interaction photopeak events in high purity Germanium cameras to improve sensitivity with no apparent degradation in spatial resolution. This procedure is based on an energy comparison between the energy deposited at two interaction sites for photons of up to 255 keV. To determine the sensitivity improvement quantitatively, we simulated the photon transport process for 140 keV photons in detail for Ge detectors having thicknesses of 1.00 to 2.00 cm in 0.25 cm steps. Discrete HPGe cameras were modeled using pixel sizes of (1.0 mm)/sup 2/, (1.5 mm)/sup 2/, and (2.0 mm)/sup 2/. Our results indicate sensitivity improvements of 29-42%, depending on detector thickness and pixel size.
- Research Organization:
- Siemens Gammasonics, Inc., 2000 Nuclear Drive, Des Plaines, IL 60018
- OSTI ID:
- 5953242
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Vol. 30:1
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
HIGH-PURITY GE DETECTORS
EFFICIENCY
SENSITIVITY
SPATIAL RESOLUTION
GAMMA CAMERAS
KEV RANGE 01-10
KEV RANGE 10-100
KEV RANGE 100-1000
PHOTONS
RADIATION DETECTORS
SIMULATION
X-RAY DETECTION
CAMERAS
DETECTION
ELEMENTARY PARTICLES
ENERGY RANGE
GE SEMICONDUCTOR DETECTORS
KEV RANGE
MASSLESS PARTICLES
MEASURING INSTRUMENTS
RADIATION DETECTION
RESOLUTION
SEMICONDUCTOR DETECTORS
440103* - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation