skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary

Abstract

SIRIS is a promising new technique which, within one year, should be able to measure ppB elemental concentrations of a variety of elements in certain classes of solids. In the medium range future (approx. 5 years) the technique can potentially be extended to the ppt level for elemental determination and the ppB level for isotopic ratios. The advantages of this system over SIMS and other present analytical methods are increased sensitivity, direct sampling, increased selectivity, and a broader range of accessible elements and molecules. The main disadvantage at this time is the inability for simultaneous detection of chemically different species; this inability impacts heavily the capabilities for simultaneous multielement analysis, atomization-ionization diagnostics, and chemical speciation.

Publication Date:
Research Org.:
National Bureau of Standards, Washington, DC (USA)
OSTI Identifier:
5912243
Report Number(s):
DOE/ER/60185-T4
ON: DE85009046
DOE Contract Number:  
AI05-83ER60185
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; MASS SPECTROSCOPY; ELEMENTS; EVALUATION; IONIZATION; ISOTOPE RATIO; RESONANCE; TRACE AMOUNTS; SPECTROSCOPY; 400104* - Spectral Procedures- (-1987)

Citation Formats

. Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary. United States: N. p., 1983. Web.
. Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary. United States.
. Sat . "Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary". United States.
@article{osti_5912243,
title = {Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary},
author = {},
abstractNote = {SIRIS is a promising new technique which, within one year, should be able to measure ppB elemental concentrations of a variety of elements in certain classes of solids. In the medium range future (approx. 5 years) the technique can potentially be extended to the ppt level for elemental determination and the ppB level for isotopic ratios. The advantages of this system over SIMS and other present analytical methods are increased sensitivity, direct sampling, increased selectivity, and a broader range of accessible elements and molecules. The main disadvantage at this time is the inability for simultaneous detection of chemically different species; this inability impacts heavily the capabilities for simultaneous multielement analysis, atomization-ionization diagnostics, and chemical speciation.},
doi = {},
url = {https://www.osti.gov/biblio/5912243}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1983},
month = {1}
}

Technical Report:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that may hold this item. Keep in mind that many technical reports are not cataloged in WorldCat.

Save / Share: