Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary
Abstract
SIRIS is a promising new technique which, within one year, should be able to measure ppB elemental concentrations of a variety of elements in certain classes of solids. In the medium range future (approx. 5 years) the technique can potentially be extended to the ppt level for elemental determination and the ppB level for isotopic ratios. The advantages of this system over SIMS and other present analytical methods are increased sensitivity, direct sampling, increased selectivity, and a broader range of accessible elements and molecules. The main disadvantage at this time is the inability for simultaneous detection of chemically different species; this inability impacts heavily the capabilities for simultaneous multielement analysis, atomization-ionization diagnostics, and chemical speciation.
- Publication Date:
- Research Org.:
- National Bureau of Standards, Washington, DC (USA)
- OSTI Identifier:
- 5912243
- Report Number(s):
- DOE/ER/60185-T4
ON: DE85009046
- DOE Contract Number:
- AI05-83ER60185
- Resource Type:
- Technical Report
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; MASS SPECTROSCOPY; ELEMENTS; EVALUATION; IONIZATION; ISOTOPE RATIO; RESONANCE; TRACE AMOUNTS; SPECTROSCOPY; 400104* - Spectral Procedures- (-1987)
Citation Formats
. Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary. United States: N. p., 1983.
Web.
. Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary. United States.
. Sat .
"Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary". United States.
@article{osti_5912243,
title = {Evaluation of sputter-initiated resonance ionization spectroscopy (SIRIS) as a new tool for direct compositional analysis: report on NBS visit to Atom Sciences. Executive summary},
author = {},
abstractNote = {SIRIS is a promising new technique which, within one year, should be able to measure ppB elemental concentrations of a variety of elements in certain classes of solids. In the medium range future (approx. 5 years) the technique can potentially be extended to the ppt level for elemental determination and the ppB level for isotopic ratios. The advantages of this system over SIMS and other present analytical methods are increased sensitivity, direct sampling, increased selectivity, and a broader range of accessible elements and molecules. The main disadvantage at this time is the inability for simultaneous detection of chemically different species; this inability impacts heavily the capabilities for simultaneous multielement analysis, atomization-ionization diagnostics, and chemical speciation.},
doi = {},
url = {https://www.osti.gov/biblio/5912243},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1983},
month = {1}
}