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Title: The domain wall distortion of magnetically written bits in GdTbFe thin films

Journal Article · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (USA)
DOI:https://doi.org/10.1109/20.104701· OSTI ID:5876830
; ;  [1]
  1. NTT Applied Electronics Lab., 162 Tokai, Ibaraki 319-11 (JP)

The distortion of the bits which are formed by a magnetic head has been studied on GdTbFe films. From read/write tests, it is found that reproduction noise is strongly affected by the film sputtering gas pressure (0.2 - 0.6Pa); high Ar pressure causes less reproduction noise. Jitter analysis with a magneto-optical read head indicates that domain wall distortion decreases as the deposition pressure increases. This distortion amplitude is found to roughly coincide with the distance bewteen iron microcrystallites (about 10 {Angstrom} to 60 {Angstrom} in diameter) which are assumed to provide nucleation sites for magnetization reversal.

OSTI ID:
5876830
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (USA), Vol. 26:5; ISSN 0018-9464
Country of Publication:
United States
Language:
English