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Title: Free-ion yield for tetramethylsilane and tetramethylgermanium

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5858122
; ; ; ;  [1]; ; ; ; ; ; ;  [2];  [3];  [4];  [5]
  1. Tohoku Gakuin Univ. (Japan). Dept. of Engineering
  2. Tohoku Univ. (Japan). Dept. of Physics
  3. Saitama Coll. of Health (Japan)
  4. Kyoto Univ. (Japan). Dept. of Physics
  5. Niigata Univ. (Japan). Dept. of Physics

In high energy physics experiments, calorimeters are used to measure the total energy dissipated by the primary particles produced from high energy collisions. In one type of calorimeter, ionization chambers filled with liquid argon are used. The necessity of a cryostat in many cases prevents a compact chamber design. Hence, it is very desirable to have liquid ionization chambers operating at room temperature. From this view point, hydrocarbon liquids are intensively investigated as calorimeter media in high energy physics experiments. TMS and TMG are promising liquid materials because they have the properties of a large electron drift velocity and a large free-ion yield. The free-ion yield determines the sensitivity of the chamber and amplifier system to ionizing particles. Here, free-ion yields from [sup 207]Bi conversion electrons were measured as a function of applied electric field in an ionization chamber filled with tetramethylsilane (TMS) or tetramethylgermanium (TMG), which were purified by simple methods. Also, the mean thermalization length of electrons liberated in the liquid was calculated by fitting a Gaussian form for the distribution function. The total free-ion yield and thermalization length in TMS and TMG were obtained to be 3.1 [+-] 0.3, 3.5 [+-] 0.2 and 191 [+-] 12[angstrom], respectively, including the impurity effect in liquid.

OSTI ID:
5858122
Report Number(s):
CONF-921005-; CODEN: IETNAE
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:4 part 1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Orlando, FL (United States), 25-31 Oct 1992; ISSN 0018-9499
Country of Publication:
United States
Language:
English