Optical properties and stoichiometry of reactively evaporated VO/sub 2/ thin films
Many of the physical properties of VO/sub 2/ are highly dependent on sample preparation. Although thin-film deposition technology has improved markedly in recent years, very few qualitative changes in the deposition of VO/sub 2/ thin films have been reported during this time. This thesis reports the first successful reactive evaporation of high-quality VO/sub 2/ films. Oxygen pressure and flow were controlled to about 1%. The film temperature was controlled to +/-4/sup 0/C. The greatest source of process instability was the deposition rate. For typical deposition parameters of 520/sup 0/C, 11 x 10/sup -4/ torr oxygen pressure, and a 30A/min deposition rate, the reactively evaporated VO/sub 2/ thin films were qualitatively similar to the films deposited by other means as reported in the literature. But for deposition parameters of 590/sup 0/C, 12-2 x 10/sup -4/ torr of oxygen, and 30A/min, unique optical properties were discovered; the film (transmission) color changed from blue to red at the semiconductor to metal transition of 65/sup 0/C. The expected behavior is a brass color in both phases. All films with the blue/red colors had positive temperature coefficients of resistivity. Increased grain sizes, increased resistivity ratios, and decreased adhesion accompanied the unique optical behavior.
- Research Organization:
- Cornell Univ., Ithaca, NY (USA)
- OSTI ID:
- 5830678
- Resource Relation:
- Other Information: Thesis (Ph. D.)
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
VANADIUM OXIDES
OPTICAL PROPERTIES
STOICHIOMETRY
DEPOSITION
EVAPORATION
HIGH TEMPERATURE
THIN FILMS
CHALCOGENIDES
FILMS
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
TRANSITION ELEMENT COMPOUNDS
VANADIUM COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties