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Title: Optical properties and stoichiometry of reactively evaporated VO/sub 2/ thin films

Thesis/Dissertation ·
OSTI ID:5830678

Many of the physical properties of VO/sub 2/ are highly dependent on sample preparation. Although thin-film deposition technology has improved markedly in recent years, very few qualitative changes in the deposition of VO/sub 2/ thin films have been reported during this time. This thesis reports the first successful reactive evaporation of high-quality VO/sub 2/ films. Oxygen pressure and flow were controlled to about 1%. The film temperature was controlled to +/-4/sup 0/C. The greatest source of process instability was the deposition rate. For typical deposition parameters of 520/sup 0/C, 11 x 10/sup -4/ torr oxygen pressure, and a 30A/min deposition rate, the reactively evaporated VO/sub 2/ thin films were qualitatively similar to the films deposited by other means as reported in the literature. But for deposition parameters of 590/sup 0/C, 12-2 x 10/sup -4/ torr of oxygen, and 30A/min, unique optical properties were discovered; the film (transmission) color changed from blue to red at the semiconductor to metal transition of 65/sup 0/C. The expected behavior is a brass color in both phases. All films with the blue/red colors had positive temperature coefficients of resistivity. Increased grain sizes, increased resistivity ratios, and decreased adhesion accompanied the unique optical behavior.

Research Organization:
Cornell Univ., Ithaca, NY (USA)
OSTI ID:
5830678
Resource Relation:
Other Information: Thesis (Ph. D.)
Country of Publication:
United States
Language:
English

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