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Title: X-ray microscopy using collimated and focussed synchrotron radiation

Conference ·
OSTI ID:5825447

X-ray microscopy is a field that has developed rapidly in recent years. Two different approaches have been used. Zone plates have been employed to produce focused beams with sizes as low as 0.07 ..mu..m for x-ray energies below 1 keV. Images of biological materials and elemental maps for major and minor low Z have been produced using above and below absorption edge differences. At higher energies collimators and focusing mirrors have been used to make small diameter beams for excitation of characteristic K- or L-x rays of all elements in the periodic table. The practicality of a single instrument combining all the features of these two approaches is unclear. The use of high-energy x rays for x-ray microscopy has intrinsic value for characterization of thick samples and determination of trace amounts of most elements. A summary of work done on the X-26 beam line at the National Synchrotron Light Source (NSLS) with collimated and focused x rays with energies above 4 keV is given here. 6 refs., 5 figs., 1 tab.

Research Organization:
Brookhaven National Lab., Upton, NY (USA); Chicago Univ., IL (USA); Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC02-76CH00016; AC03-76SF00098
OSTI ID:
5825447
Report Number(s):
BNL-40374; CONF-8708150-5; ON: DE88002120
Resource Relation:
Conference: 36. annual Denver X-ray conference, Denver, CO, USA, 3 Aug 1987; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English