Radiation testing of the CMOS 8085 microprocessor family
Radiation testing of the SA3000 family, CMOS versions of the Intel 8085 microprocessor family, has demonstrated full functionality after 3 x 10/sup 6/ rad (Si) total dose. Static supply currents measured after reset increased from approximately 50 etaA to 500 ..mu..A at V/sub DD/ = 10V while maximum operating frequency decreased from greater than 10 MHz to 4 MHz at V/sub DD/ = 9V post 3 x 10/sup 6/ rad (Si). Output drive currents decreased 25% post 1 x 10/sup 6/ rad (Si) and 40% post 3 x 10/sup 6/ rad (Si). The nominal threshold voltage shift of discrete transistors measured under worst-case bias (n-channels, ON; p-channels, OFF) shifted -0.5 volts and -2.40 volts post 1 x 10/sup 6/ rad (Si) for n-channel and p-channel MOSFETs, respectively. Transient radiation upset levels of about 1 x 10/sup 9/ rad (Si)/sec have been measured for parts from this family. Latch-up immunity has been demonstrated up to 1 x 10/sup 12/ rad (Si)/sec and electrical bench tests are discussed which prove this technology is immune to latch-up. The technology used for the SA3000 family is a 3..mu..m silicon gate process fabricated in n and n+ epitaxial silicon. Functional test programs for each chip of the family are discussed.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5766018
- Report Number(s):
- SAND-83-0615C; CONF-830714-13; ON: DE83014604
- Resource Relation:
- Conference: 20. IEEE annual conference on nuclear and space radiation effects, Gatlinburg, TN, USA, 18 Jul 1983
- Country of Publication:
- United States
- Language:
- English
Similar Records
Thirty megarad CMOS gate array for spacecraft applications
Radiation-hardened bulk Si-gate CMOS microprocessor family
Related Subjects
MICROPROCESSORS
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
ANNEALING
DOSE RATES
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
EPITAXY
EXPERIMENTAL DATA
MEMORY DEVICES
MHZ RANGE 01-100
SILICON
TRANSISTORS
COMPUTERS
CURRENTS
DATA
ELECTRONIC CIRCUITS
ELEMENTS
FREQUENCY RANGE
HEAT TREATMENTS
INFORMATION
MHZ RANGE
MICROELECTRONIC CIRCUITS
NUMERICAL DATA
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SEMIMETALS
TESTING
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems