Photo ion spectrometer
This patent describes a method for performing quantitative spectroscopic analysis by energy and angular refocusing of ions of a selected atomic component from a sample and sensing the ions with a detector. It comprises: generating near the sample a volume containing the selected atomic component; ionizing the selected atomic component in the volume near the sample generating electrical field conditions for extracting the ionized atomic component; inputting the extracted ionic atomic component to an electrostatic analyzer; applying a first 180{degrees} spherical electrostatic field to the input extracted ionic atomic component for energy analyzing the ionic component and generating an output beam; refocusing the output beam using a telescopic electrostatic lens system to provide a refocused beam; and, applying a second 180{degrees} spherical electrostatic field to the refocused beam for completing the energy analyzing process and focusing the energy beam on the detector.
- Assignee:
- Arch Development Corp., Chicago, IL (USA)
- Patent Number(s):
- US 4864130; A
- Application Number:
- PPN: US 6-870437A; TRN: 91-021928
- OSTI ID:
- 5729663
- Resource Relation:
- Patent File Date: 4 Jun 1986
- Country of Publication:
- United States
- Language:
- English
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Photo ion spectrometer