Profiling and mapping of advanced materials using spatially resolved Raman spectroscopy

Conference · Thu Aug 01 00:00:00 EDT 1991

OSTI ID:5718896

Ager, III, J W; Veirs, D K; Lee, H Q; Rosenblatt, G M

We have developed a technique to profile important physical and chemical properties of materials based upon simultaneous acquisition of Raman spectra along a laser illumination line, coupled with extensive and rapid spectral analysis to extract the desired information. The technique uses a two-dimensional spectroscopic detector and, in contrast to Hadamard techniques, sample movement in one dimension that allows all collected light to be detected. Property maps comprised of the analysis results of more than 10,000 Raman spectra can be built up from successive profiles in a few hours. In order to increase efficiency, the data for one profile are analyzed while the data for the next profile are collected. Two recent applications are discussed: measuring spatial variations in crystalline quality in CVD-grown diamond thin films and mapping transformed zones produced by compressive stress in a bulk sample of phase-stabilized zirconia (PSZ).

• Research Organization: Lawrence Berkeley Lab., CA (United States)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5718896
• Report Number(s): LBL-30462; CONF-910872-9; ON: DE92008304
• Resource Relation: Conference: 25. annual Microbeam Analysis Society meeting, San Jose, CA (United States), 4-9 Aug 1991
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DIAMONDS
RAMAN SPECTRA
ZIRCONIUM OXIDES
CHEMICAL PROPERTIES
PHYSICAL PROPERTIES
SAMPLE PREPARATION
THIN FILMS
CARBON
CHALCOGENIDES
ELEMENTAL MINERALS
ELEMENTS
FILMS
MINERALS
NONMETALS
OXIDES
OXYGEN COMPOUNDS
SPECTRA
TRANSITION ELEMENT COMPOUNDS
ZIRCONIUM COMPOUNDS
360202* - Ceramics
Cermets
& Refractories- Structure & Phase Studies
360602 - Other Materials- Structure & Phase Studies