TEM analysis of enclosed crystal microstructures and interfaces
The study of enclosed crystal shapes in relation to their interface structure is an area of phase transformations rich in new and interesting phenomena. It is shown that transmission electron microscopy (TEM) can make an important contribution to the understanding and control of materials properties through the experimental study of these phenomena by conventional, analytical, high resolution, diffraction and dynamic in-situ techniques. There is a close connection between the morphology, interface structure, defect substructure, and formation mechanism of precipitates in a solid matrix. Complementary to static observations, dynamic in-situ experiments by high voltage electron microscopy show that germanium precipitates in an aluminum matrix can be transformed between a strongly faceted, anisotropic shape and a rounded, isotropic shape.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- Sponsoring Organization:
- USDOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5695667
- Report Number(s):
- LBL-29592; ON: DE91012344
- Country of Publication:
- United States
- Language:
- English
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