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Title: Preparation and properties of evaporated CdTe films compared with single crystal CdTe. Progress report No. 4, August 1-October 31, 1981

Technical Report ·
DOI:https://doi.org/10.2172/5627195· OSTI ID:5627195

The hot-wall vacuum evaporation system is nearly complete and the first films are expected in early December. CdTe homojunction cells were theoretically modelled and to some extent tested experimentally using the n-type CdTe film on p-type CdTe crystal homojunction cells previously deposited at Linz. Modelling emphasizes the known importance of surface recombination velocity for such homojunction cells. The n-type layer on the experimental cell was thinned by etching from 5 micrometers to 1.5 micrometers, with a corresponding increase in short-circuit current from 0.1 to 1 mA/cm/sup 2/. This behavior is as theoretically expected; to obtain a short-circuit current of 11 mA/cm/sup 2/, as required for a 10% cell, requires a thickness of about 0.2 micrometers for a surface recombination velocity of 10/sup 6/ cm/sec and other realistic cell parameters. By doping experiments on single crystal CdTe, it has been shown that the hole density does decrease when the P dopant density is decreased below a critical value in CdTe:P crystals, thus eliminating the possibility that the major acceptors in the P-doped crystals were not P impurity. Attempts to heavily dope CdTe with As were less successful, but this may be due to the use of elemental As as the dopant in this case rather than a compound of the dopant. Cs was shown to be an effective dopant of CdTe and resistivities as low as 0.3 ohm-cm corresponding to hole densities in the low 10/sup 17/ cm/sup -3/ range were obtained. An apparent correlation between the low-temperature barrier height associated with a grain boundary in CdTe and the angle of mismatch between the two grains has been observed. Improved capacitance of grain boundary measurements should yield defect densities.

Research Organization:
Solar Energy Research Inst. (SERI), Golden, CO (United States)
DOE Contract Number:
AC02-77CH00178
OSTI ID:
5627195
Report Number(s):
SERI/PR-9330-1-T4; ON: DE82003925
Country of Publication:
United States
Language:
English