Automatic testing of microprocessors in radiation environments
Journal Article
·
· AIAA Stud. J.; (United States)
OSTI ID:5614847
A system for the acquisition of real-time failure data has been designed for in-situ total ionizing dose testing of large-scale integrated circuits. System selection considerations are discussed. Data acquisition and analysis features are described using the Intel MCS-51 microcontroller family as an example.
- Research Organization:
- Harry Diamond Labs., Adelphi, MD
- OSTI ID:
- 5614847
- Journal Information:
- AIAA Stud. J.; (United States), Vol. 5
- Country of Publication:
- United States
- Language:
- English
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