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Title: Hole-capture properties of the electron-irradiation-induced deep-level H sub 5 in p -type InP: A charge-controlled bistable model

Journal Article · · Physical Review (Section) B: Condensed Matter; (USA)
; ;  [1]
  1. Groupe d'Etudes des Semiconducteurs, U.S.T.L., place E. Bataillon, 34060 Montpellier CEDEX, France (FR)

The electron-induced irradiated defect {ital H}{sub 5} in Zn-doped {ital p}-type InP is an unusual hole trap, since its temperature-independent weak-hole capture cross section, {sigma}{sub {ital c}}{similar to}10{sup {minus}21} cm{sup 2}, is 6 orders of magnitude lower than the value obtained from thermal-emission rates. We present a charge-controlled bistable configuration-coordinate diagram that explains this large difference and accounts for the optical-absorption properties. In addition, a microscopic {ital D}{sub In}{sup {ital n}+}-Zn{sup {minus}} defect, made by pairing under electrostatic attraction of the ionized acceptor Zn{sup {minus}} and of a positively charged primitive defect {ital D}{sub In}{sup {ital n}+} of the In sublattice, is tentatively proposed as a plausible complex at the origin of {ital H}{sub 5}.

OSTI ID:
5613450
Journal Information:
Physical Review (Section) B: Condensed Matter; (USA), Vol. 40:6; ISSN 0163-1829
Country of Publication:
United States
Language:
English