Nanometer-scale structure for the study of flux-line lattice shearing in superconducting double layers of a-Nb/sub 3/Ge and NbN

Journal Article · Fri Jan 01 00:00:00 EST 1988 · J. Vac. Sci. Technol., B; (United States)

DOI:https://doi.org/10.1116/1.583982· OSTI ID:5613077

v d Drift, E; Radelaar, S; Pruymboom, A; Kes, P H

The fabrication of a nanometer-scale device structure for the study of flux-line lattice shearing in a superconducting double layer of 500-nm amorphous Nb/sub 3/Ge (bottom) and 50-nm polycrystalline NbN (top) is reported. The device, serving as a model system for technical type-II superconductors, consists of an array of channels in the NbN top layer, each about 100 nm wide and 500 ..mu..m long. The preliminary measurements show unique features of flux line shear in a well-defined channel structure.

• Research Organization: Centre for Submicron Technology, Delft University of Technology, Delft, The Netherlands
• OSTI ID: 5613077
• Journal Information: J. Vac. Sci. Technol., B; (United States), Vol. 6:1
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
GERMANIUM COMPOUNDS
CRITICAL CURRENT
MAGNETIC FLUX
NIOBIUM COMPOUNDS
NIOBIUM NITRIDES
SUPERCONDUCTING DEVICES
FABRICATION
EXPERIMENTAL DATA
LAYERS
SUPERCONDUCTING FILMS
CURRENTS
DATA
ELECTRIC CURRENTS
FILMS
INFORMATION
NITRIDES
NITROGEN COMPOUNDS
NUMERICAL DATA
PNICTIDES
REFRACTORY METAL COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
420201* - Engineering- Cryogenic Equipment & Devices