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Title: High-power, pulsed-microwave measurements of critical currents in thin films of Y-Ba-Cu-O and Nb

Journal Article · · Physical Review, B: Condensed Matter; (USA)
; ; ;  [1]
  1. IBM Research Division, P.O. Box 218, Yorktown Heights, New York 10598 (US)

The microwave (16.5-GHz) surface resistance of superconducting Y-Ba-Cu-O and Nb thin films is observed to increase with increasing applied microwave power. At higher powers, Nb films have been driven normal. These effects are attributed to high induced-current densities, approaching the critical values. From these measurements, values for the product {lambda}{ital J}{sub {ital c}} have been derived, and for Nb we have obtained the temperature dependence of this quantity. By using known values of {lambda}, the values of {ital J}{sub {ital c}} at microwave frequencies have been obtained.

OSTI ID:
5591821
Journal Information:
Physical Review, B: Condensed Matter; (USA), Vol. 43:13; ISSN 0163-1829
Country of Publication:
United States
Language:
English

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