Investigation of matrix effects on the neutral fractions ejected from ion-bombarded, uranium-containing solids using resonance ionization mass spectrometry

Journal Article · Mon Feb 15 00:00:00 EST 1988 · Anal. Chem.; (United States)

DOI:https://doi.org/10.1021/ac00155a015· OSTI ID:5572932

Goeringer, D E; Christie, W H; Valiga, R E

Resonance ionization mass spectrometry (RIMS) has been used to investigate the effect of the sample matrix on the yields of U, UO, and UO/sub 2/ neutrals desorbed from ion-bombarded, uranium-containing solids. The yield of corresponding secondary ions was also examined by secondary ion mass spectrometry (SIMS). Samples studied were uranium metal, UO/sub 2/ (polycrystalline and single crystal), and U/sub 3/O/sub 8/. The overall efficiency of detection, U/sup +/ photoions counted/U atoms sputtered, was approximately 9 x 10/sup -4/. Results indicate that the density of ground-state U atoms sputtered from such samples is quite sensitive to oxygen content and surface contamination. The relative ratio of ground-state U atoms sputtered from U metal and UO/sub 2/ (U/sup 0/ metal/U/sup 0/ oxide) with Ar/sup +/ was estimated as 4.4 X 10/sup 1/. This relatively large matrix effect severely limits the applicability of SA/RIMS to quantitative analysis of uranium samples.

• Research Organization: Oak Ridge National Lab., TN
• OSTI ID: 5572932
• Journal Information: Anal. Chem.; (United States), Vol. 60:4
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
URANIUM
ION MICROPROBE ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
RESONANCE IONIZATION MASS SPECTROSCOPY
SPUTTERING
URANIUM OXIDES
ARGON IONS
EXPERIMENTAL DATA
MASS SPECTROSCOPY
QUANTITY RATIO
ACTINIDE COMPOUNDS
ACTINIDES
CHALCOGENIDES
CHARGED PARTICLES
CHEMICAL ANALYSIS
DATA
ELEMENTS
INFORMATION
IONS
METALS
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
SPECTROSCOPY
URANIUM COMPOUNDS
400102* - Chemical & Spectral Procedures